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| Name：Bryanhek | 23, Mar, 2024 17:00:21 | |
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it has been shown that the formation of copper oxide on the Cu(_2)S surface plays a significant role in the degradation of CdS Cu(_2) S devices. The extent of the cross over between the dark and light J V characteristics is a function of the period of etching used prior to junction formation. Year T | |
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